LED Wafer Process Equipment/Machine
Sapphire Thickness Measuring Machine

›› None-touched laser detector, Z axis auto adjust the distence of laser detector

›› Measurement for 4 process (Wax, Grinding, 1st step polishing, 2nd step polishing).

›› PC may link with CIM and up-load the measuring data to particular file folder in WEB harddisk.

›› Allow to proceed offline measurement.


Sapphire Wafer Laser Marking machine

›› 4 Axial (X,Y,Z,θ) control.

›› CCD detect and auto adjust the shift of X,Y,θ

›› Top or bottom side marking.

›› The marking data can be summarize and filing.


Sapphire Thickness Sorting Machine

›› Server moter control the location of cassette

›› 3 Axial (X,Y,Z) control

›› Used Laser detector, precision ±2um (untouched measurment).

›› The cassette numbering can be set up by reading bar code label of work sheet and summary the measuring data in file.